DocumentCode
2951253
Title
Relationship between field emission current characteristic and electrical breakdown in vacuum
Author
Makabe, D. ; Sone, M. ; Mitsui, H. ; Takahashi, E. ; Ebe, A. ; Ogata, K.
Author_Institution
Musashi Inst. of Technol., Tokyo, Japan
Volume
2
fYear
1997
fDate
19-22, Oct 1997
Firstpage
599
Abstract
It has been assumed that an electrical breakdown in vacuum is caused by field emission electrons emitted from a cathode surface. And these field emission electrons emitted from microprotrusions on the cathode surface. It has been recognized that this electron´s current is expressed by F-N theory. Therefore, it is thought that a characteristic of a field emission current has influence on the electrical breakdown in vacuum. In this study, the electrical breakdown voltage in vacuum gap was measured in order to investigate whether the correlation exists between this voltage and the characteristic of the field emission current. At this time, the field emission current was measured from appearance of electron to just before electrical breakdown in vacuum, by using a Micro Channel Plate (MCP) and a pico-ammeter. As the result, it is guessed that the characteristic of field emission current has influence on the electrical breakdown. Because the applied voltage to keep the same field emission current correlates to the electrical breakdown voltage in all cathodes when the field emission current is near to the electrical breakdown
Keywords
electron field emission; vacuum breakdown; Fowler-Nordheim theory; cathode surface; electrical breakdown voltage; field emission current; micro channel plate; microprotrusions; pico-ammeter; vacuum gap; Anodes; Breakdown voltage; Cathodes; Current measurement; Electric breakdown; Electric variables measurement; Electrodes; Electron emission; Vacuum breakdown; Vacuum technology;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-3851-0
Type
conf
DOI
10.1109/CEIDP.1997.641145
Filename
641145
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