• DocumentCode
    2951253
  • Title

    Relationship between field emission current characteristic and electrical breakdown in vacuum

  • Author

    Makabe, D. ; Sone, M. ; Mitsui, H. ; Takahashi, E. ; Ebe, A. ; Ogata, K.

  • Author_Institution
    Musashi Inst. of Technol., Tokyo, Japan
  • Volume
    2
  • fYear
    1997
  • fDate
    19-22, Oct 1997
  • Firstpage
    599
  • Abstract
    It has been assumed that an electrical breakdown in vacuum is caused by field emission electrons emitted from a cathode surface. And these field emission electrons emitted from microprotrusions on the cathode surface. It has been recognized that this electron´s current is expressed by F-N theory. Therefore, it is thought that a characteristic of a field emission current has influence on the electrical breakdown in vacuum. In this study, the electrical breakdown voltage in vacuum gap was measured in order to investigate whether the correlation exists between this voltage and the characteristic of the field emission current. At this time, the field emission current was measured from appearance of electron to just before electrical breakdown in vacuum, by using a Micro Channel Plate (MCP) and a pico-ammeter. As the result, it is guessed that the characteristic of field emission current has influence on the electrical breakdown. Because the applied voltage to keep the same field emission current correlates to the electrical breakdown voltage in all cathodes when the field emission current is near to the electrical breakdown
  • Keywords
    electron field emission; vacuum breakdown; Fowler-Nordheim theory; cathode surface; electrical breakdown voltage; field emission current; micro channel plate; microprotrusions; pico-ammeter; vacuum gap; Anodes; Breakdown voltage; Cathodes; Current measurement; Electric breakdown; Electric variables measurement; Electrodes; Electron emission; Vacuum breakdown; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
  • Conference_Location
    Minneapolis, MN
  • Print_ISBN
    0-7803-3851-0
  • Type

    conf

  • DOI
    10.1109/CEIDP.1997.641145
  • Filename
    641145