• DocumentCode
    2951645
  • Title

    Adaptive Dual AK-D Tree Search Algorithm for ICP Registration Applications

  • Author

    Lee, Jiann-Der ; Hsieh, Shih-Sen ; Huang, Chung-Hsien ; Liu, Li-Chang ; Wu, Chien-Tsai ; Lee, Shin-Tseng ; Chen, Jyi-Feng

  • Author_Institution
    Dept. of Electr. Eng., Chang Gung Univ.
  • fYear
    2006
  • fDate
    9-12 July 2006
  • Firstpage
    177
  • Lastpage
    180
  • Abstract
    An algorithm for finding coupling points plays an important role in the iterative closest point algorithm (ICP) which is widely used in registration applications in medical and 3-D architecture areas. In recent researches of finding coupling points, Approximate K-D tree search algorithm (AK-D tree) is an efficient nearest neighbor search algorithm with comparable results. We proposed adaptive dual AK-D tree search algorithm (ADAK-D tree) for searching and synthesizing coupling points as significant control points to improve the registration accuracy in ICP registration applications. ADAK-D tree utilizes AK-D tree twice in different geometrical projection orders to reserve true nearest neighbor points used in later ICP stages. An adaptive threshold in ADAK-D tree is used to reserve sufficient coupling points for a smaller alignment error. Experimental results are shown that the registration accuracy of using ADAK-D tree is improved more than the result of using AK-D tree and the computation time is acceptable
  • Keywords
    approximation theory; image registration; iterative methods; medical image processing; tree searching; 3-D architecture area; ICP; adaptive dual AK-D; approximate K-D tree search algorithm; coupling point; geometrical projection; iterative closest point algorithm; medical image; registration application; Augmented reality; Biomedical imaging; Hospitals; Iterative algorithms; Iterative closest point algorithm; Nearest neighbor searches; Neurosurgery; Robustness; Runtime; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Multimedia and Expo, 2006 IEEE International Conference on
  • Conference_Location
    Toronto, Ont.
  • Print_ISBN
    1-4244-0366-7
  • Electronic_ISBN
    1-4244-0367-7
  • Type

    conf

  • DOI
    10.1109/ICME.2006.262598
  • Filename
    4036565