Title :
Digital detection of parametric faults in data converters
Author :
Vinnakota, Bapiraju ; Harjani, Ramesh
Author_Institution :
Minnesota Univ., Minneapolis, MN, USA
Abstract :
Multiple parametric faults due to normal process variations are extremely important for analog circuits. Very few analog DFT techniques target multiple parametric faults. In this paper we present a DFT scheme that targets high performance analog circuits. In particular, we target a popular switched-capacitor based A/D converter. The DFT scheme is based on an analog-to-digital capacitor ratio converter circuit. The circuit is used to completely characterize the transfer function of a charge redistribution A/D converter. Extensive simulation results that include practical process variations are used to verify our DFT scheme
Keywords :
analogue integrated circuits; analogue-digital conversion; design for testability; fault diagnosis; integrated circuit design; integrated circuit testing; monolithic integrated circuits; switched capacitor networks; transfer functions; ADC capacitor ratio converter circuit; DFT technique; SC-based A/D converter; analog circuits; analog-to-digital converter; charge redistribution ADC; data converters; digital detection; parametric faults; switched-capacitor based ADC; transfer function; Analog circuits; Analog-digital conversion; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Switched capacitor circuits; Switching converters; Transfer functions; Voltage;
Conference_Titel :
Custom Integrated Circuits, 1999. Proceedings of the IEEE 1999
Conference_Location :
San Diego, CA
Print_ISBN :
0-7803-5443-5
DOI :
10.1109/CICC.1999.777263
