Title :
Minimum MSE based regularization for system identification in the presence of input and output noise
Author :
Xin, J. ; Ohmori, H. ; Sano, A.
Author_Institution :
Dept. of Electr. Eng., Keio Univ., Yokohama, Japan
Abstract :
The corrected least squares (CLS) approach gives a consistent estimate of a system model in the presence of input and output noises. However, when the input signal is band-limited or strongly correlated, and/or a transfer function model is identified by using an overdetermined model, the CLS estimate often becomes ill-conditioned. To overcome this problem, we propose a regularized CLS estimation method by introducing multiple regularization parameters to minimize the mean squares error (MSE) of the regularized CLS estimate. The asymptotic MSE can be evaluated by considering the third and fourth cross moments of the input and output noises, and an analytical expression of the optimal regularization parameters minimizing the MSE is also clarified. Furthermore, an effective regularization algorithm is given by using only accessible input-output data. The relationship between the regularization using multiple parameters and the truncation of small eigenvalues is investigated and then it is clarified that the proposed regularization scheme is also efficient to decide the order of a transfer function model
Keywords :
discrete time systems; eigenvalues and eigenfunctions; error analysis; least mean squares methods; linear systems; parameter estimation; transfer functions; corrected least squares; cross moments; discrete time systems; eigenvalues; input noise; linear systems; mean squares error; multiple regularization parameters; output noise; parameter estimation; system identification; transfer function model; Eigenvalues and eigenfunctions; Error correction; Finite impulse response filter; Least squares approximation; Mean square error methods; Noise measurement; Parameter estimation; Signal processing; System identification; Transfer functions;
Conference_Titel :
Decision and Control, 1995., Proceedings of the 34th IEEE Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-2685-7
DOI :
10.1109/CDC.1995.480602