DocumentCode
29520
Title
Debugging RTL Using Structural Dominance
Author
Mangassarian, Hratch ; Bao Le ; Veneris, Andreas
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
Volume
33
Issue
1
fYear
2014
fDate
Jan. 2014
Firstpage
153
Lastpage
166
Abstract
Register-transfer level (RTL) debug has become a resource-intensive bottleneck in modern very large scale integration computer-aided design flows, consuming as much as 32% of the total verification effort. This paper aims to advance the state-of-the-art in automated RTL debuggers, which return all potential bugs in the RTL, called solutions, along with corresponding corrections. First, an iterative algorithm is presented to compute the dominance relationships between RTL blocks. These relationships are leveraged to discover implied solutions with every new solution, thus significantly reducing the number of formal engine calls. Furthermore, a modern Boolean satisfiability (SAT) solver is tailored to detect debugging nonsolutions, sets of RTL blocks guaranteed to be bug-free, and to imply other nonsolutions using the precomputed RTL dominance relationships. Extensive experiments on industrial designs show a three-fold reduction in the number of SAT calls due to solution implications, coupled with faster SAT run-times due to nonsolution implications, resulting in a 2.63x overall speedup in total SAT solving time, demonstrating the robustness and practicality of the proposed approach.
Keywords
Boolean functions; VLSI; circuit CAD; computability; formal verification; Boolean satisfiability solver; SAT solver; automated RTL debuggers; formal engine calls; formal verification; industrial designs; iterative algorithm; register-transfer level; resource-intensive bottleneck; structural dominance; three-fold reduction; very large scale integration computer-aided design flows; Algorithm design and analysis; Debugging; Engines; Logic gates; Sequential circuits; Synchronization; Very large scale integration; Design debugging; SAT; diagnosis; formal methods; formal verification;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/TCAD.2013.2278491
Filename
6685866
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