• DocumentCode
    29520
  • Title

    Debugging RTL Using Structural Dominance

  • Author

    Mangassarian, Hratch ; Bao Le ; Veneris, Andreas

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Toronto, Toronto, ON, Canada
  • Volume
    33
  • Issue
    1
  • fYear
    2014
  • fDate
    Jan. 2014
  • Firstpage
    153
  • Lastpage
    166
  • Abstract
    Register-transfer level (RTL) debug has become a resource-intensive bottleneck in modern very large scale integration computer-aided design flows, consuming as much as 32% of the total verification effort. This paper aims to advance the state-of-the-art in automated RTL debuggers, which return all potential bugs in the RTL, called solutions, along with corresponding corrections. First, an iterative algorithm is presented to compute the dominance relationships between RTL blocks. These relationships are leveraged to discover implied solutions with every new solution, thus significantly reducing the number of formal engine calls. Furthermore, a modern Boolean satisfiability (SAT) solver is tailored to detect debugging nonsolutions, sets of RTL blocks guaranteed to be bug-free, and to imply other nonsolutions using the precomputed RTL dominance relationships. Extensive experiments on industrial designs show a three-fold reduction in the number of SAT calls due to solution implications, coupled with faster SAT run-times due to nonsolution implications, resulting in a 2.63x overall speedup in total SAT solving time, demonstrating the robustness and practicality of the proposed approach.
  • Keywords
    Boolean functions; VLSI; circuit CAD; computability; formal verification; Boolean satisfiability solver; SAT solver; automated RTL debuggers; formal engine calls; formal verification; industrial designs; iterative algorithm; register-transfer level; resource-intensive bottleneck; structural dominance; three-fold reduction; very large scale integration computer-aided design flows; Algorithm design and analysis; Debugging; Engines; Logic gates; Sequential circuits; Synchronization; Very large scale integration; Design debugging; SAT; diagnosis; formal methods; formal verification;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2013.2278491
  • Filename
    6685866