• DocumentCode
    2952649
  • Title

    Influences of sites and protocols on inducing ventricular fibrillation: A computer simulation study

  • Author

    Zheng, Yi ; Wei, Daming ; Fang, Zuxiang ; Zhu, Xin

  • Author_Institution
    Dept. of Electron. Eng., Fudan Univ., Shanghai, China
  • fYear
    2010
  • fDate
    Aug. 31 2010-Sept. 4 2010
  • Firstpage
    2005
  • Lastpage
    2008
  • Abstract
    In cardiac electrophysiological study, several electrical stimulation protocols have been employed to induce ventricular fibrillations (VF). In addition, sites of inducing may have different impacts on inducing results as well as different inducing protocols. To study whether VF inducing method is determinant of induced outcome, we simulated VFs induced with different protocols at different sites based on the Wei-Harumi whole heart model. Simulations showed that only certain combinations of pacing protocols and sites could induce sustainable VFs, which had similar frequency distributions. This result suggested that the interactions between protocols and sites determine the odds of successful inducing but once the VF was induced, the pattern was solely determined by inner cardiac properties.
  • Keywords
    bioelectric phenomena; biological organs; cardiovascular system; electrocardiography; medical computing; physiological models; Wei-Harumi whole heart model; cardiac electrophysiological study; computer simulation; electrical stimulation protocols; frequency distributions; ventricular fibrillation; Biological system modeling; Computational modeling; Electrocardiography; Fibrillation; Heart; Humans; Protocols; Algorithms; Cardiac Pacing, Artificial; Computer Simulation; Data Interpretation, Statistical; Electrocardiography; Heart; Heart Ventricles; Humans; Programming Languages; Software; Time Factors; Treatment Outcome; Ventricular Fibrillation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2010 Annual International Conference of the IEEE
  • Conference_Location
    Buenos Aires
  • ISSN
    1557-170X
  • Print_ISBN
    978-1-4244-4123-5
  • Type

    conf

  • DOI
    10.1109/IEMBS.2010.5627858
  • Filename
    5627858