• DocumentCode
    2952839
  • Title

    The design of some novel 0.050-in. grid high-density circuit pack-to-backplane connectors

  • Author

    Akkapeddi, Kaushik S.

  • Author_Institution
    AT&T Bell Labs., Whippany, NJ, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    92
  • Lastpage
    98
  • Abstract
    Three high-density connectors (HDCs) are discussed. All provide a butt connection to the backplane on an orthogonal 0.050-in grid (80 I/Os per inch of circuit pack height). All connectors have four columns of contacts, yielding 560 I/Os on an 8-in-high circuit pack. Two of these connectors, the circuit pack header and the printed/molded connector, connect to an array of 0.050-in-grid gold-plated pads on the backplane and the circuit pack through a unidirectional conductive elastomer called the conductive polymer interconnect (CPI). The sheet of CPI elastomer conducts in the thickness direction only. The other connector, called the flex connector, uses a highly compliant, high temperature-resistant elastomer to make direct metal-to-metal connection to the arrays of gold-plated pads on the backplane and the circuit pack. A battery of reliability tests has been conducted on the HDC system. The flex connector exhibited stable electrical resistance. The test results on the other two connectors using CPI have yielded information on how to improve the connector designs
  • Keywords
    design engineering; electric connectors; environmental testing; printed circuit accessories; 0.05 in; 8 in; I/Os; butt connection; circuit pack header; circuit pack height; compliant elastomer; conductive polymer interconnect; connector designs; electrical resistance; flex connector; gold-plated pads; high temperature-resistant elastomer; high-density circuit pack-to-backplane connectors; high-density connectors; metal-to-metal connection; orthogonal grid; printed/molded connector; reliability tests; unidirectional conductive elastomer; Backplanes; Batteries; Circuit testing; Connectors; Contacts; Electric resistance; Flexible printed circuits; Integrated circuit interconnections; Polymers; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77733
  • Filename
    77733