Title :
Functional and catastrophic thermal failures in bipolar electronic circuits
Author :
Górecki, Krzysztof ; Stepowicz, Witold J. ; Zarebsk, Janusz
Author_Institution :
Dept. of Marine Electron., Gdynia Maritime Acad., Gdynia
Abstract :
In semiconductor devices interactions between electrical and thermal effects result from the selfheating phenomenon. Due to selfheating and non-ideal heat transfer from a device to surroundings, the junction (inside) temperature rise above the ambient temperature is observed, and as a result the form of the d.c. characteristics of devices can be essentially changed. This temperature rise can lead to functional failure of the circuit in which the device is used, or to catastrophic failure of the device. In the paper some examples of such circuits as the transistor switch and the differential pair are described.
Keywords :
bipolar integrated circuits; bipolar transistor circuits; bipolar transistors; integrated circuit modelling; bipolar electronic circuits; bipolar transistor; catastrophic thermal failure; differential pair; functional failure; nonideal heat transfer; selfheating; semiconductor devices; transistor; Bipolar transistors; Circuit analysis computing; Electronic circuits; Electrothermal effects; Impedance; SPICE; Semiconductor devices; Switches; Temperature dependence; Thermal resistance;
Conference_Titel :
Electronics, Circuits and Systems, 2005. ICECS 2005. 12th IEEE International Conference on
Conference_Location :
Gammarth
Print_ISBN :
978-9972-61-100-1
Electronic_ISBN :
978-9972-61-100-1
DOI :
10.1109/ICECS.2005.4633593
