DocumentCode
2952946
Title
Wavefront measurement using electro-optic scanning with a liquid-crystal SLM
Author
Laude, V. ; Olivier, S. ; Dirson, C. ; Huignard, J.-P.
Author_Institution
Corp. Res. Lab., Thomson-CSF, Orsay, France
fYear
2000
fDate
10-15 Sept. 2000
Abstract
Summary form only given. The developed wavefront sensor is based on the original Hartmann principle in which the aperture can be moved across the wavefront to analyze by an electro-optic programmable device. According to the operation principle the position of the diffraction pattern is measured on a CCD detector array at a distance d behind a lens of focal length f. If (x´,y´) is the measured position of the beam transmitted by the aperture moving on the SLM, the local wavefront slope at position (x,y) can be derived. This data is stored in a memory for each position of the sampling aperture displayed on the spatial light modulator (SLM) and which sequentially scans the wavefront.
Keywords
CCD image sensors; electro-optical devices; liquid crystal devices; optical scanners; spatial light modulators; wavefront sensors; CCD detector array; diffraction pattern; electro-optic programmable device; electro-optic scanning; focal length; liquid-crystal SLM; local wavefront slope; operation principle; original Hartmann principle; sampling aperture; sequential wavefront scanning; spatial light modulator; wavefront measurement; wavefront sensor; Apertures; Charge coupled devices; Detectors; Diffraction; Electrooptic devices; Length measurement; Lenses; Position measurement; Sampling methods; Sensor arrays;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location
Nice
Print_ISBN
0-7803-6319-1
Type
conf
DOI
10.1109/CLEOE.2000.910127
Filename
910127
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