Title :
Cross-validation and neural network architecture selection for the classification of intracranial current sources
Author :
Vasios, C.E. ; Matsopoulos, G.K. ; Ventouras, E.M. ; Nikita, K.S. ; Uzunoglu, N.
Author_Institution :
Athinoula A. Martinos Center for Biomed. Imaging, Charlestown, MA, USA
Abstract :
In the present paper, a new methodological approach, for the classification of first episode schizophrenic patients (FES) against normal controls, is proposed. The first step of the methodology applied is the feature extraction, which is based on the combination of the multivariate autoregressive model with the simulated annealing technique, in order to extract optimum features, in terms of classification rate. The classification, as the second step of the methodology, is implemented by means of an artificial neural network (ANN) trained with the backpropagation algorithm under "leave-one-out cross-validation". The ANN is a multilayer perceptron, the architecture of which is selected after a detailed search. The proposed methodology has been applied for the classification of FES patients and normal controls using as input signals the intracranial current sources obtained by the inversion of event-related potentials (ERP) using an algebraic reconstruction technique. Results implementing the proposed methodology provide classification rates of up to 93%.
Keywords :
autoregressive processes; backpropagation; bioelectric potentials; diseases; feature extraction; medical signal processing; multilayer perceptrons; neural net architecture; pattern classification; simulated annealing; ANN training; algebraic reconstruction; artificial neural network; backpropagation algorithm; classification rate; event-related potentials; feature extraction; first episode schizophrenic patients; intracranial current sources; leave-one-out cross-validation; multilayer perceptron; multivariate autoregressive model; neural network architecture selection; optimum features; simulated annealing; Artificial neural networks; Biomedical imaging; Brain modeling; Computer architecture; Data mining; Electroencephalography; Enterprise resource planning; Equations; Feature extraction; Neural networks;
Conference_Titel :
Neural Network Applications in Electrical Engineering, 2004. NEUREL 2004. 2004 7th Seminar on
Print_ISBN :
0-7803-8547-0
DOI :
10.1109/NEUREL.2004.1416561