Spatial resolution of nonlinear refractive index and third-order susceptibility measurements by Mach-Zehnder interferometry technique

Author

Boudebs, Georges ; Dorkenou, K. ; Chis, M. ; Nguyen Phu, X.

Author_Institution

Lab. des Proprietes Opt. des Mater. et Appl., Univ. d´Angers, France

fYear

2000

fDate

10-15 Sept. 2000

Abstract

Summary form only. The measurement technique we report here is based on using a Mach-Zehnder interferometer with pump-probe system. By doing so, the classical interference pattern used in Mach-Zehnder interferometer is modified by a pump beam introducing nonlinearities in the sample. The interference pattern at the output of the setup has been acquired on a CCD camera.

Keywords

CCD image sensors; Fourier transform optics; Mach-Zehnder interferometers; light interferometry; nonlinear optical susceptibility; optical pumping; refractive index measurement; CCD camera; Mach-Zehnder interferometer; Mach-Zehnder interferometry technique; classical interference pattern; interference pattern; measurement technique; nonlinear refractive index; nonlinearities; pump beam; pump-probe system; spatial resolution; third-order susceptibility measurements; Cameras; Charge coupled devices; Fourier transforms; Frequency; Interference; Interferometry; Laser excitation; Pixel; Refractive index; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on

Conference_Location

Nice

Print_ISBN

0-7803-6319-1

Type

conf

DOI

10.1109/CLEOE.2000.910154

Filename

910154