DocumentCode
2953440
Title
Suggested triple-series connection measurement tests of the AC quantized Hall resistance and the AC longitudinal resistance
Author
Cage, M.E. ; Jeffery, A. ; Elmquist, R.E.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
1998
fDate
6-10 July 1998
Firstpage
341
Lastpage
342
Abstract
Based on equivalent circuit calculations a single AC ratio bridge can be used to accurately determine the AC quantized Hall resistance and to provide an independent value of the AC longitudinal resistance in a quantum Hall device. This may be achieved by making quantized Hall resistance measurements for two different combinations of triple-series connections to a standards-quality device.
Keywords
Hall effect devices; bridge circuits; electric resistance measurement; equivalent circuits; measurement standards; quantum Hall effect; 2DEG; AC longitudinal resistance; AC quantized Hall resistance; equivalent circuit calculations; quantum Hall device; resistance standard; single AC ratio bridge; triple-series connection measurement tests; Bridge circuits; Circuit testing; Electrical resistance measurement; Electrons; Equivalent circuits; Frequency measurement; Impedance measurement; Laboratories; Measurement standards; NIST;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.699941
Filename
699941
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