Title :
Optical correlation technique for characterizing of rough surfaces
Author_Institution :
Correlation Opt. Dept., Chernivtsy Univ., Ukraine
Abstract :
Summary form only. It is known that power spectral density function, (PSDF), describing inhomogeneity distribution among different spatial frequencies is considered as preferable and the most comprehensive technique. But conventional profilometric techniques for reconstruction of PSDF are rather labor- and time-consuming and are implemented using expensive measuring equipment. In the report we will consider as example a new optical correlation measuring device for estimation of PSDF of slightly rough surfaces. Our device is based on polarization interferometer consisting of the tandem of two identical calcite wedges forming a plane-parallel plate, which are placed between the crossed linear polarisers.
Keywords :
light interferometry; optical correlation; optical polarisers; surface topography measurement; PSDF; calcite wedges; correlation measuring device; crossed linear polarisers; inhomogeneity distribution; optical correlation technique; plane-parallel plate; polarization interferometer; power spectral density function; profilometric techniques; rough surface measurement; slightly rough surface measurement; spatial frequencies; Delay; Ellipsoids; Frequency estimation; Holographic optical components; Holography; Optical surface waves; Rough surfaces; Surface reconstruction; Surface roughness; Visualization;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910193