Title :
Measurements of optical losses in thin films
Author_Institution :
Dept. of Sci. & Technol., Corning Inc., NY, USA
Abstract :
Summary form only. Three experimental approaches for detection of optical losses in thin films for the telecommunication wavelength region are discussed. These techniques are cavity ring down spectroscopy, photothermal and propagation loss methods. Results for thin film loss evaluation in various applications are shown.
Keywords :
optical films; optical loss measurement; optical resonators; photothermal spectroscopy; spectroscopy; 1230 to 1340 nm; 1430 to 1625 nm; cavity ring down spectroscopy; optical loss measurement; photothermal methods; propagation loss methods; telecommunication wavelength region; thin film loss evaluation; thin films; Large Hadron Collider; Loss measurement; Nonlinear optics; Optical films; Optical losses; Optical propagation; Optical pulses; Optical sensors; Ring oscillators; Wavelength measurement;
Conference_Titel :
Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on
Conference_Location :
Nice
Print_ISBN :
0-7803-6319-1
DOI :
10.1109/CLEOE.2000.910195
