• DocumentCode
    2954207
  • Title

    Using 10 V Josephson voltage standards to estimate the uncertainty of Zener voltage references as travelling standards

  • Author

    Lo-Hive, J.P. ; Reymann, D. ; Geneves, G.

  • Author_Institution
    BNM-LCIE, Fontenay-aux-Roses, France
  • fYear
    1998
  • fDate
    6-10 July 1998
  • Firstpage
    349
  • Lastpage
    350
  • Abstract
    In anticipation of the start of a European comparison of 10 V Josephson array voltage standards (EUROMET project 429 led by NMi VSL), the BIPM and the BNM-LCIE Josephson standards have been compared by means of Zener travelling references. An overall spread of 5 parts in 10/sup 9/ has been found with a standard uncertainty of 6 parts in 10/sup 9/. These results show that the performance of the Zener references could be the main cause of uncertainty in such a comparison.
  • Keywords
    Zener diodes; measurement standards; measurement uncertainty; superconducting junction devices; voltage measurement; 10 V; BIPM; BNM-LCIE; EUROMET project; Josephson array voltage standard; Zener voltage reference; measurement uncertainty; travelling standard; Availability; Battery charge measurement; Laboratories; Measurement standards; Niobium; Switches; Temperature; Uncertainty; Video recording; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1998 Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5018-9
  • Type

    conf

  • DOI
    10.1109/CPEM.1998.699945
  • Filename
    699945