• DocumentCode
    2954214
  • Title

    Advanced electronics for tokamak far infrared interferometers

  • Author

    Spuig, P.J. ; Barbuti, A. ; Gil, C. ; Boboc, A. ; Dorling, S. ; Jennison, M.

  • Author_Institution
    IRFM, EURATOM-CEA Assoc., St. Paul-lez-Durance, France
  • fYear
    2010
  • fDate
    24-28 May 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Tore Supra uses a ten channel FIR interferometer to measure the plasma density. The plasma density is deduced from the phase between a shifted reference beam and a probing beam that crosses the plasma, however the counting of the fringes is affected by several kinds of plasma events that make the signal too low to be reliably measured. The last upgrade of the interferometer electronic instrumentation has been carried out by the responsible physicist and the Tore Supra electronics team in order to reduce the number of so-called fringe jumps in real time. Efficient correction algorithms were developed for both Tore Supra and JET tokamaks. The use of the FPGA (Field Programmable Gate Array) technology with the VHDL language makes possible to refine more and more specific fringe jump correction algorithms. The article will focus on the technology used to implement such an instrument and will present the next generation that is planned to equip the new JET interferometer channels.
  • Keywords
    Tokamak devices; field programmable gate arrays; fusion reactor instrumentation; hardware description languages; light interferometry; plasma density; plasma diagnostics; FPGA; JET tokamak; Tore Supra electronics; VHDL language; advanced electronics; field programmable gate array; interferometer electronic instrumentation; plasma density; tokamak far infrared interferometers; Filtering theory; Interferometers; Laser beams; Phase measurement; Plasma measurements; Plasmas; Real time systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Real Time Conference (RT), 2010 17th IEEE-NPSS
  • Conference_Location
    Lisbon
  • Print_ISBN
    978-1-4244-7108-9
  • Type

    conf

  • DOI
    10.1109/RTC.2010.5750393
  • Filename
    5750393