• DocumentCode
    2954863
  • Title

    Local Intensity Order Pattern for feature description

  • Author

    Wang, Zhenhua ; Fan, Bin ; Wu, Fuchao

  • Author_Institution
    Nat. Lab. of Pattern Recognition, Inst. of Autom., Beijing, China
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    603
  • Lastpage
    610
  • Abstract
    This paper presents a novel method for feature description based on intensity order. Specifically, a Local Intensity Order Pattern(LIOP) is proposed to encode the local ordinal information of each pixel and the overall ordinal information is used to divide the local patch into subregions which are used for accumulating the LIOPs respectively. Therefore, both local and overall intensity ordinal information of the local patch are captured by the proposed LIOP descriptor so as to make it a highly discriminative descriptor. It is shown that the proposed descriptor is not only invariant to monotonic intensity changes and image rotation but also robust to many other geometric and photometric transformations such as viewpoint change, image blur and JEPG compression. The proposed descriptor has been evaluated on the standard Oxford dataset and four additional image pairs with complex illumination changes. The experimental results show that the proposed descriptor obtains a significant improvement over the existing state-of-the-art descriptors.
  • Keywords
    computational geometry; computer vision; data compression; feature extraction; image coding; image restoration; lighting; JEPG compression; LIOP descriptor; Oxford dataset; complex illumination changes; computer vision; discriminative descriptor; feature description; geometric transformations; image blur; image rotation; local intensity order pattern; local patch; monotonic intensity changes; photometric transformations; viewpoint change; Estimation; Feature extraction; Histograms; Indexes; Lighting; Robustness; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision (ICCV), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4577-1101-5
  • Type

    conf

  • DOI
    10.1109/ICCV.2011.6126294
  • Filename
    6126294