DocumentCode
2954875
Title
Removal of nitrobenzene and volatile organic compounds using electron radiation
Author
Lubicki, P. ; Cross, J.D. ; Jayaram, S. ; Zhao, J.S. ; Ward, O.
Author_Institution
Dept. of Electr. & Comput. Eng., Waterloo Univ., Ont., Canada
Volume
2
fYear
1997
fDate
19-22, Oct 1997
Firstpage
698
Abstract
Experimental results concerning removal of nitrobenzene and volatile organic compounds (VOCs), such as toluene, trichloroethylene and benzene with the use of low energy electron beam are presented. Lab scale apparatus for electron beam irradiation of water is briefly described. Total dose of β radiation was controlled by the time of water circulation (1-50 min.), accelerating voltage (Va=100-125 kV) and electron beam current (0.1-1 mA) for flow rate of 1 kg/min. The electron beam was generated in vacuum (p<10-7 Torr) produced by a system of diffusion-sorption-rotary pumps. Electrons were injected into the treated water through an electron beam permeable membrane made of boron nitride poly-crystalline ceramics with a thickness of 10 μm. A low mass density (~2 g/cm3) of the ceramic material enables to obtain a high transmission of the electron beam even for a low accelerating voltage. Dependencies of the removed content of contaminants on the total dose of β radiation are presented. Despite using low energy electron beam, the results have indicated a significant removal of nitrobenzene and VOCs treated
Keywords
beta-ray effects; electron beam applications; impurities; organic compounds; water treatment; β radiation; 100 to 125 V; benzene; boron nitride polycrystalline ceramic membrane; contaminant removal; electron beam irradiation; nitrobenzene; toluene; trichloroethylene; volatile organic compound; water; Acceleration; Biomembranes; Ceramics; Chemical hazards; Electron beams; Industrial waste; Niobium; Volatile organic compounds; Water pollution; Water resources;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1997. IEEE 1997 Annual Report., Conference on
Conference_Location
Minneapolis, MN
Print_ISBN
0-7803-3851-0
Type
conf
DOI
10.1109/CEIDP.1997.641170
Filename
641170
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