• DocumentCode
    2954998
  • Title

    Automated on-chip burn-in system for TAB reels

  • Author

    Shreeve, Robert W.

  • Author_Institution
    Hewlett Packard, Corvallis, OR, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    187
  • Lastpage
    189
  • Abstract
    A tape automated bonding (TAB) burn-in on reel system is discussed. This system has demonstrated its ability to produce significant cost advantages over singulated TAB carrier burn-in systems. The cost advantages result from the elimination of burn-in boards, higher burn-in process yields, and reduced part load/unload times. The costs for reliability testing have also decreased because of design, purchase, and debug of long-term life and moisture resistance boards is no longer required. The elimination of reliability test hardware allows larger sample sizes to be used for product reliability qualifications. Hence, higher part quality and reliability can be obtained
  • Keywords
    automatic testing; circuit reliability; environmental testing; integrated circuit testing; production testing; quality control; surface mount technology; SMT; TAB reels; cost advantages; larger sample sizes; on chip burn-in reel system; product reliability qualifications; reliability testing costs; singulated TAB carrier burn-in systems; surface mounted devices; tape automated bonding; Circuit testing; Costs; Manufacturing processes; Ovens; Packaging; Signal processing; Sockets; System testing; System-on-a-chip; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77748
  • Filename
    77748