DocumentCode
295541
Title
Performance analysis of ARQ Go-Back-N protocol in fading mobile radio channels
Author
Zorzi, Michele ; Rao, Ramesh R. ; Milstein, Laurence B.
Author_Institution
Dipartimento di Elettronica e Inf., Politecnico di Milano, Italy
Volume
2
fYear
1995
fDate
35010
Firstpage
576
Abstract
An ARQ Go-Back-N protocol with unreliable feedback and time-out mechanism is considered. Both the forward and the reverse channels are subject to fading impairments. A threshold model for successes and failures of both packets and feedback information is assumed, and the resulting success/failure processes are modeled as Markovian. Throughput and delay are analytically evaluated. For the fading channel model and this protocol, only simulation results for the throughput are available in the recent literature, whereas delay has not been studied. The match between analytical and simulation results shows that the Markov approximation is indeed very good. The analysis is useful in that it provides a fast and accurate method for throughput and delay evaluations, and can be used to choose design parameters, such as the time-out period. In particular, it is shown that there exists an optimum value for the time-out period that is different from the one commonly assumed in the literature
Keywords
Markov processes; Rayleigh channels; approximation theory; automatic repeat request; delays; fading; land mobile radio; ARQ Go-Back-N protocol; Markov approximation; Markov process; Rayleigh fading; delay; design parameters; fading channel model; fading impairments; fading mobile radio channels; feedback information; forward channel; performance analysis; reverse channel; simulation results; success/failure processes; threshold model; throughput; time out mechanism; time out period; unreliable feedback; Automatic repeat request; Delay; Fading; Feedback; Forward error correction; Land mobile radio; Performance analysis; Protocols; Strontium; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Military Communications Conference, 1995. MILCOM '95, Conference Record, IEEE
Conference_Location
San Diego, CA
Print_ISBN
0-7803-2489-7
Type
conf
DOI
10.1109/MILCOM.1995.483532
Filename
483532
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