Title :
Use of Self-Organizing Maps for texture feature selection in content-based image retrieval
Author :
Guo, Chen ; Wilson, Campbell
Author_Institution :
Fac. of Inf. Technol., Monash Univ., Caulfield East, VIC
Abstract :
The ldquosemantic gaprdquo observed in content-based image retrieval (CBIR) has become a highly active research topic in last twenty years, and it is widely accepted that domain specification is one of the most effective methods of addressing this problem. However, along with the challenge of making a CBIR system specific to a particular domain comes the challenge of making those features object dependent. independent component analysis (ICA) is a powerful tool for detecting underlying texture features in images. However, features detected in this way often contain groups of features which are essentially shifted or rotated versions of each other. Thus, a method of dimensionality reduction that takes this self-similarity into account is required. In this paper, we proposed a self-organizing map (SOM) based clustering method to reduce the dimensionality of feature space. This method comprises two phases: clustering as well as representative selection. The result of the implementation confirms this method offers effective CBIR dimensionality reduction when using the ICA method of texture feature extraction.
Keywords :
data reduction; feature extraction; image retrieval; image texture; independent component analysis; pattern clustering; self-organising feature maps; CBIR dimensionality reduction; clustering method; content-based image retrieval; independent component analysis; self-organizing map; semantic gap; texture feature detection; texture feature extraction; texture feature selection; Australia; Clustering methods; Computational efficiency; Computer vision; Content based retrieval; Feature extraction; Image retrieval; Independent component analysis; Information technology; Self organizing feature maps;
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4633882