• DocumentCode
    2955744
  • Title

    Hydrogenation effect on 1.54-μm Er luminescence in Er-doped amorphous silicon quantum dot films

  • Author

    Park, Nae-Man ; Kim, Tae-Youb ; Kim, Kyung-Hyun ; Sung, Gun Yong ; Cho, Kwan Sik ; Shin, Jung H. ; Kim, Baek-Hyun ; Park, Swng-Ju ; Lee, Jung-Kun ; Nastasi, Michael

  • Author_Institution
    Div. of Future Technol. Res., Electron. & Telecommun. Res. Inst., Daejeon, South Korea
  • fYear
    2004
  • fDate
    29 Sept.-1 Oct. 2004
  • Firstpage
    92
  • Lastpage
    94
  • Abstract
    The effect of hydrogenation on Er luminescence depending on the dot size could be explained by Er migration and the number of Er ions near a Si dot before hydrogenation. However, further studies will be needed to completely understand hydrogenation effect.
  • Keywords
    amorphous semiconductors; elemental semiconductors; erbium; hydrogenation; photoluminescence; semiconductor quantum dots; semiconductor thin films; silicon; 1.54 mum; Er ions; Er luminescence; Er migration; Er-doped silicon films; Si:Er; amorphous silicon; hydrogenation effect; quantum dot films; Amorphous silicon; Annealing; Atmosphere; Erbium; Luminescence; Materials science and technology; Nanocrystals; Quantum dots; Semiconductor films; US Department of Transportation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics, 2004. First IEEE International Conference on
  • Print_ISBN
    0-7803-8474-1
  • Type

    conf

  • DOI
    10.1109/GROUP4.2004.1416673
  • Filename
    1416673