DocumentCode
2955748
Title
Analog testing using Zero-Crossing technique
Author
Seireg, Reda ; Al Emadi, N. ; Abdel Naby, M. ; El Refaie, Osama
Author_Institution
Comput. Sci. Dept., Inst. of El Shorouk, Egypt
fYear
2002
fDate
11-13 Dec. 2002
Firstpage
237
Lastpage
240
Abstract
The functional digital testing is defined as a black and white test according to N. Nagi et al.(1998) and B. Vinnakota(1998) by other words, it can determine faulty and non faulty boards. But the analog faults are not. The faulty and non-faulty are relatively defined depending on tolerance allowed for non-faulty boards. In this paper, we introduce a new universal method based on Zero-Crossing technique to evaluate the faulty circuits. The effect of tolerance from 0 to 20% in frequency and amplitude has been formulated. The simulation has been done by MATLAB. The results indicate the simplicity of the proposed method.
Keywords
analogue circuits; automatic test pattern generation; MATLAB; analog faults; analog testing; digital testing; faulty boards; faulty circuits evaluation; nonfaulty board; zero-crossing technique; Circuit faults; Circuit testing; Compaction; Computer science; Detectors; Educational institutions; Frequency; Military computing; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics, The 14th International Conference on 2002 - ICM
Print_ISBN
0-7803-7573-4
Type
conf
DOI
10.1109/ICM-02.2002.1161538
Filename
1161538
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