DocumentCode
2955890
Title
TTTC: Test Technology Technical Council
fYear
2009
fDate
7-9 Oct. 2009
Abstract
Provides a listing of current committee members and society officers.
Keywords
Art; Conferences; Electronic equipment testing; Logic design; Logic testing; Meetings; System testing; Technical Councils; Technical activities; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1550-5774
Print_ISBN
978-0-7695-3839-6
Type
conf
DOI
10.1109/DFT.2009.60
Filename
5372214
Link To Document