DocumentCode
2956022
Title
A high accurate test standard of ADC, DAC and its experiment results
Author
Tong Guangqiu ; Zhang Xiuzeng ; Zou Benxia ; Qian Zhongtai ; He Qiang
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
1998
fDate
6-10 July 1998
Firstpage
369
Lastpage
370
Abstract
An automatic test standard of the static properties of ADC and DAC and its constituted technology are introduced. With some special techniques, we made a 24 bits inside standard DAC. The test speed can be from 40 Hz/spl sim/25 kHz. The measurement results are also submitted.
Keywords
analogue-digital conversion; automatic test equipment; automatic test software; calibration; digital-analogue conversion; measurement standards; 24 bit; ADC; DAC; automatic test standard; combined feedback amplifier; computer control; high accurate test standard; linearity error; self-calibration; static properties; Automatic testing; Circuit testing; Control systems; Instruments; Interference; Isolators; Linearity; Microcomputers; Power system stability; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location
Washington, DC, USA
Print_ISBN
0-7803-5018-9
Type
conf
DOI
10.1109/CPEM.1998.699955
Filename
699955
Link To Document