• DocumentCode
    2956043
  • Title

    Multi Gbit-scale partially frozen (PF) NAND DRAM with SDRAM compatible interface

  • Author

    Fujino, T. ; Arimoto, K.

  • Author_Institution
    ULSI Lab., Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    1998
  • fDate
    11-13 June 1998
  • Firstpage
    96
  • Lastpage
    99
  • Abstract
    In order to realize Gbit-scale DRAM in a small chip size, the NAND DRAM cell is a good candidate, however, open bit line (BL) arrangement and multiplexed sensing is necessary as used in a conventional NAND DRAM. We propose a novel PF-NAND cell which achieve the folded BL arrangement and non-multiplexed sensing. A new sense amplifier which is preferable for low voltage operated NAND DRAM is also developed. Furthermore, an SDRAM compatible interface is realized by introducing cache SRAM and wide-band I/O array architecture between the PF-NAND DRAM and cache SRAM.
  • Keywords
    DRAM chips; NAND circuits; VLSI; NAND DRAM cell; SDRAM compatible interface; cache SRAM architecture; dynamic RAM; folded bit line arrangement; low voltage operation; multi Gbit-scale DRAM; nonmultiplexed sensing; partially frozen NAND DRAM; sense amplifier; wideband I/O array architecture; Broadband amplifiers; Cache memory; Laboratories; Lithography; Random access memory; SDRAM; Tin; Ultra large scale integration; Voltage; Wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Circuits, 1998. Digest of Technical Papers. 1998 Symposium on
  • Conference_Location
    Honolulu, HI, USA
  • Print_ISBN
    0-7803-4766-8
  • Type

    conf

  • DOI
    10.1109/VLSIC.1998.688014
  • Filename
    688014