Title :
Error Correction Codes for SEU and SEFI Tolerant Memory Systems
Author :
Pontarelli, S. ; Cardarilli, G.C. ; Re, M. ; Salsano, A.
Author_Institution :
Univ. of Rome "Tor Vergata", Rome, Italy
Abstract :
In this paper a modification of the Hsiao SEC-DED (Single Error Correction, Double Error Detection) code is presented. The proposed code is still a SEC-DED code, but it is also able to correct a byte erasure. This code has been developed to protect the memory chips of a spaceborne computer against SEU (Single Event Upset) and SEFI (Single Event Functional Interruption) faults. The code rate of our proposed code is the same of the Hsiao code and is particularly suitable for byte organized 64-bits memory systems. In fact, for these systems a (72,64) code can be constructed and a memory organization based on nine chips can be designed. The byte erasure correction allows to tolerate the occurrence of a SEFI fault in one of the memory chips without data loss.
Keywords :
error correction codes; fault tolerance; integrated memory circuits; radiation hardening (electronics); Hsiao code; byte erasure; error correction codes; memory chips; single event functional interruption; single event upset; spaceborne computer; word length 64 bit; Circuit faults; Computer errors; Error correction; Error correction codes; Face detection; Fault tolerant systems; Protection; Single event upset; Switches; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6