DocumentCode
2956359
Title
Transient Error Detection and Recovery in Processor Pipelines
Author
Shazli, Syed Z. ; Tahoori, Mehdi B.
Author_Institution
Northeastern Univ., Boston, MA, USA
fYear
2009
fDate
7-9 Oct. 2009
Firstpage
304
Lastpage
312
Abstract
Transient errors, due to cosmic radiations, are a major reliability barrier for modern processors. The vulnerability of processor cores to transient errors grows exponentially with technology scaling. To meet reliability constraints in a cost-effective way, it is critical to localize the effects of these errors and prevent them from propagating to other parts of the system. In this paper, we present a methodology to provide low-cost transient error detection and recovery in processor pipelines. Using the approach transient errors can be detected and the processor can recover from the effects without adding additional structures outside the pipeline. In this technique, we use error control coding for detection and correction of error in pipeline stages. We also reuse the hazard detection mechanisms commonly used in modern processor pipelines for efficient and transparent error recovery. Experimental results confirm the efficiency of the proposed technique in terms of reliability (100% error detection, correction and recovery) and overhead (15% area and 25% delay overhead).
Keywords
VLSI; delays; error correction; error detection; integrated circuit reliability; microprocessor chips; pipeline processing; radiation effects; transients; VLSI system; cosmic radiation; delay overhead; error control coding; error correction; error recovery; hazard detection mechanism; low-cost transient error detection; microprocessors; processor cores; processor pipelines; reliability; Error correction; Fault detection; Fault tolerant systems; Hazards; Pipelines; Protection; Radiation detectors; Runtime; Single event transient; Very large scale integration; Soft Errors; Transient error recovery; processor pipelines;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1550-5774
Print_ISBN
978-0-7695-3839-6
Type
conf
DOI
10.1109/DFT.2009.38
Filename
5372242
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