• DocumentCode
    2956359
  • Title

    Transient Error Detection and Recovery in Processor Pipelines

  • Author

    Shazli, Syed Z. ; Tahoori, Mehdi B.

  • Author_Institution
    Northeastern Univ., Boston, MA, USA
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    304
  • Lastpage
    312
  • Abstract
    Transient errors, due to cosmic radiations, are a major reliability barrier for modern processors. The vulnerability of processor cores to transient errors grows exponentially with technology scaling. To meet reliability constraints in a cost-effective way, it is critical to localize the effects of these errors and prevent them from propagating to other parts of the system. In this paper, we present a methodology to provide low-cost transient error detection and recovery in processor pipelines. Using the approach transient errors can be detected and the processor can recover from the effects without adding additional structures outside the pipeline. In this technique, we use error control coding for detection and correction of error in pipeline stages. We also reuse the hazard detection mechanisms commonly used in modern processor pipelines for efficient and transparent error recovery. Experimental results confirm the efficiency of the proposed technique in terms of reliability (100% error detection, correction and recovery) and overhead (15% area and 25% delay overhead).
  • Keywords
    VLSI; delays; error correction; error detection; integrated circuit reliability; microprocessor chips; pipeline processing; radiation effects; transients; VLSI system; cosmic radiation; delay overhead; error control coding; error correction; error recovery; hazard detection mechanism; low-cost transient error detection; microprocessors; processor cores; processor pipelines; reliability; Error correction; Fault detection; Fault tolerant systems; Hazards; Pipelines; Protection; Radiation detectors; Runtime; Single event transient; Very large scale integration; Soft Errors; Transient error recovery; processor pipelines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3839-6
  • Type

    conf

  • DOI
    10.1109/DFT.2009.38
  • Filename
    5372242