• DocumentCode
    2956440
  • Title

    Optimizing Parametric BIST Using Bio-inspired Computing Algorithms

  • Author

    Nemati, Nastaran ; Simjour, Amirhossein ; Ghofrani, AmirAli ; Navabi, Zainalabedin

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Tehran, Tehran, Iran
  • fYear
    2009
  • fDate
    7-9 Oct. 2009
  • Firstpage
    268
  • Lastpage
    276
  • Abstract
    Optimizing the BIST configuration based on the characteristics of the design under test is a complicated and challenging work for test engineers. Since this problem has multiple optimization factors, trapping in local optimums is very plausible. Therefore, regular computing algorithms cannot efficiently resolve this problem and utilization of some algorithms is required. In this work, by applying genetic algorithm (GA) and particle swarm optimization (PSO) - which are two well-known bio-inspired computing algorithms -, reconfiguring an optimum parametric BIST is exercised. These methods are applied to configure a parametric BIST for some ISCAS benchmarks, and the efficiency of the resulted configuration is evaluated by means of Verilog HDL procedural language interface (PLI).Using HDL environment along with bio-inspired algorithms, significant advantages over previous works are obtained.
  • Keywords
    VLSI; built-in self test; genetic algorithms; particle swarm optimisation; BIST; ISCAS benchmarks; VLSI; Verilog HDL procedural language interface; bio-inspired computing algorithms; built-in self-test; genetic algorithm; local optimum trapping; multiple optimization factors; particle swarm optimization; Algorithm design and analysis; Biology computing; Built-in self-test; Circuit faults; Computer architecture; Design engineering; Design for testability; Design optimization; Hardware design languages; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
  • Conference_Location
    Chicago, IL
  • ISSN
    1550-5774
  • Print_ISBN
    978-0-7695-3839-6
  • Type

    conf

  • DOI
    10.1109/DFT.2009.55
  • Filename
    5372246