Characterization of AlGaAs waveguides for three-wave mixing

Author

Leo, G. ; Caldarella, C. ; Assanto, Gaetano ; Durand, O. ; De Rossi, A. ; Calligaro, M. ; Marcadet, X. ; Berger, V.

Author_Institution

Dipartimento di Energia Elettrica, Rome Univ., Italy

fYear

2000

fDate

10-15 Sept. 2000

Abstract

Summary form only given. We report on accurate measurements of layer thicknesses, modal effective indices and guided-wave losses. The thickness in the multilayer have been measured through Kiessig fringe analysis in X-ray reflectometry. This lead to an accurate estimation of AlGaAs percentage in MBE grown GaAs-AlGaAs superlattices.

Keywords

III-V semiconductors; aluminium compounds; gallium arsenide; measurement errors; molecular beam epitaxial growth; multiwave mixing; optical testing; optical waveguides; reflectometry; semiconductor superlattices; thickness measurement; AlGaAs percentage; AlGaAs waveguides; GaAs-AlGaAs; GaAs-AlGaAs superlattices; Kiessig fringe analysis; MBE grown; X-ray reflectometry; accurate measurements; guided-wave losses; layer thickness measurement; modal effective indices; multilayer; three-wave mixing; Holographic optical components; Holography; Nonhomogeneous media; Nonlinear optics; Optical frequency conversion; Optical mixing; Optical refraction; Optical waveguides; Sea measurements; Thickness measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Lasers and Electro-Optics Europe, 2000. Conference Digest. 2000 Conference on

Conference_Location

Nice

Print_ISBN

0-7803-6319-1

Type

conf

DOI

10.1109/CLEOE.2000.910358

Filename

910358