DocumentCode
2956800
Title
Coded DNA Self-Assembly for Error Detection/Location
Author
Arani, Zahra Mashreghian ; Hashempour, Masoud ; Lombardi, Fabrizio
Author_Institution
Dept. of ECE, Northeastern Univ., Boston, MA, USA
fYear
2009
fDate
7-9 Oct. 2009
Firstpage
103
Lastpage
111
Abstract
This paper proposes a novel framework in which DNA self-assembly can be analyzed for error detection/ location. The proposed framework relies on coding and mapping functions that allow to establish the presence of erroneous bonded tiles based on the pattern to be assembled (as defined by the tile set) and its current aggregate. As a widely used pattern and instantiation of this process, the Sierpinski Triangle self-assembly is analyzed in detail.
Keywords
DNA; error detection codes; nanofabrication; self-assembly; Sierpinski triangle self-assembly; coded DNA self-assembly; error detection; error location; error resilience; mapping functions; Aggregates; Assembly; Bonding; DNA; Error analysis; Error correction; Fault detection; Manufacturing; Self-assembly; Tiles; Coding; Error Detection; Error Resilience; Nano Manufacturing;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location
Chicago, IL
ISSN
1550-5774
Print_ISBN
978-0-7695-3839-6
Type
conf
DOI
10.1109/DFT.2009.13
Filename
5372266
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