Title :
Challenges in Delay Testing of Integrated Circuits
Author_Institution :
Dept. of Comput. Sci. & Eng., Texas A&M Univ., College Station, TX, USA
Abstract :
Delay testing of integrated circuits is increasingly focused on detecting small delay defects, and improving correlation to functional test. In this talk we will describe our recent efforts and results on industrial designs.
Keywords :
delays; integrated circuit testing; delay testing; functional test; industrial designs; integrated circuits; small delay defect detection; Automatic test pattern generation; Circuit faults; Circuit testing; Costs; Crosstalk; Delay; Integrated circuit testing; Power dissipation; System testing; Timing; delay test; small delay defects;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.53
