Title :
Novel High Speed Robust Latch
Author :
Omaña, Martin ; Rossi, Daniele ; Metra, Cecilia
Author_Institution :
DEIS, Univ. of Bologna, Bologna, Italy
Abstract :
In this paper we propose a new robust latch, referred to as HiPeR latch. It is insensitive to TFs affecting its internal and output nodes by design (independently of the size of its transistors), thus being scalable with technology node. It presents better or comparable robustness to TFs compared to the most recent latches in literature, while providing better characteristics in terms of performance at comparable area and power cost.
Keywords :
VLSI; failure analysis; transistors; VLSI; high-performance robust latch; high-speed robust latch; internal nodes; output nodes; transient faults; transistors; Capacitance; Circuits; Fault tolerant systems; Feedback loop; Latches; Logic; Robustness; Single event upset; Very large scale integration; Voltage; robust latch; soft error; transient fault;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.40