Title :
Soft Core Embedded Processor Based Built-In Self-Test of FPGAs
Author :
Dutton, Bradley F. ; Stroud, Charles E.
Author_Institution :
Dept. of Electr. & Comput. Eng., Auburn Univ., Auburn, AL, USA
Abstract :
This paper presents the first implementation of built-in self-test (BIST) of field programmable gate arrays (FPGAs) using a soft core embedded processor for reconfiguration of the FPGA resources under test, control of BIST execution, retrieval of BIST results, and fault diagnosis. The approach was implemented in Xilinx Virtex-5 FPGAs but is applicable to any FPGA that contains an internal configuration memory access port.
Keywords :
built-in self test; embedded systems; field programmable gate arrays; integrated circuit testing; microprocessor chips; FPGA; Xilinx Virtex-5; built-in self test; field programmable gate arrays; internal configuration memory access port; soft core embedded processor; Automatic testing; Built-in self-test; Circuit testing; Fabrics; Fault diagnosis; Fault tolerant systems; Field programmable gate arrays; Logic testing; Reconfigurable logic; System testing; Built-In Self-Test; Field Programmable Gate Array; Soft Processor; Xilinx Virtex-5;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2009. DFT '09. 24th IEEE International Symposium on
Conference_Location :
Chicago, IL
Print_ISBN :
978-0-7695-3839-6
DOI :
10.1109/DFT.2009.51
