DocumentCode
2956993
Title
The complexity analysis of fault simulation algorithm for digital circuits
Author
Yunzhan, Gong
Author_Institution
Center for Comput., Armed Force Eng. Inst., Beijing, China
fYear
1996
fDate
21-24 Oct 1996
Firstpage
372
Lastpage
375
Abstract
Fault simulation consists of simulating a circuit in the presence of faults. Comparing the fault simulation results with those of the fault free simulation of the same circuit simulated with the same applied test T, we can determine the faults detected by T. Fault simulation has many applications. Based on the experimental results, this paper analyses the computational complexity of every fault simulation algorithm
Keywords
automatic testing; circuit analysis computing; computational complexity; digital simulation; fault diagnosis; logic testing; applied test; complexity analysis; computational complexity; digital circuits; fault free simulation; fault simulation algorithm; Algorithm design and analysis; Analytical models; Circuit analysis computing; Circuit faults; Circuit simulation; Circuit testing; Computational complexity; Computational modeling; Digital circuits; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
ASIC, 1996., 2nd International Conference on
Conference_Location
Shanghai
Print_ISBN
7-5439-0940-5
Type
conf
DOI
10.1109/ICASIC.1996.562830
Filename
562830
Link To Document