Title :
The complexity analysis of fault simulation algorithm for digital circuits
Author_Institution :
Center for Comput., Armed Force Eng. Inst., Beijing, China
Abstract :
Fault simulation consists of simulating a circuit in the presence of faults. Comparing the fault simulation results with those of the fault free simulation of the same circuit simulated with the same applied test T, we can determine the faults detected by T. Fault simulation has many applications. Based on the experimental results, this paper analyses the computational complexity of every fault simulation algorithm
Keywords :
automatic testing; circuit analysis computing; computational complexity; digital simulation; fault diagnosis; logic testing; applied test; complexity analysis; computational complexity; digital circuits; fault free simulation; fault simulation algorithm; Algorithm design and analysis; Analytical models; Circuit analysis computing; Circuit faults; Circuit simulation; Circuit testing; Computational complexity; Computational modeling; Digital circuits; System testing;
Conference_Titel :
ASIC, 1996., 2nd International Conference on
Conference_Location :
Shanghai
Print_ISBN :
7-5439-0940-5
DOI :
10.1109/ICASIC.1996.562830
