• DocumentCode
    2957025
  • Title

    Mechanical behaviors of 60/40 tin-lead solder lap joints

  • Author

    Enke, Neal F. ; Kilinski, Thomas J. ; Schroeder, Scott A. ; Lesniak, Jon R.

  • Author_Institution
    Dept. of Eng. Mech., Wisconsin Univ., Madison, WI, USA
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    264
  • Lastpage
    272
  • Abstract
    Creep-fatigue interactions have been shown to play a critical role in the failure of surface mount solder joints. Monotonic, fatigue, and creep-fatigue data for 60/40 tin-lead solder lap joints at room temperature are presented. Monotonic tests performed include rapid-strain shear, creep, and stress relaxation tests. Fundamental data for the strain range partitioning (SRP) approach to creep-fatigue life-prediction are presented. SRP is found to model adequately the solder creep-fatigue response for the range of frequencies (0.007 to 0.5 Hz) and waveforms tested. Instantaneous plastic strains and viscoplastic strains are found to be equally damaging, in any combination, for isothermal room-temperature creep-fatigue. Fatigue lives obtained for 0.5-Hz tests performed under load control correlate with the lives to 50% load drop obtained for tests performed under strain control
  • Keywords
    creep testing; fatigue testing; lead alloys; soldering; stress relaxation; stress-strain relations; tin alloys; 0.007 to 0.5 Hz; SnPb solder lap joints; creep tests; creep-fatigue data; creep-fatigue interactions; elastic properties; fatigue data; fatigue lines; isothermal room-temperature creep-fatigue; joint failure; life-prediction; load control correlate; load drop; materials testing; monotonic data; plastic strains; rapid-strain shear tests; room temperature; strain control; strain range partitioning; stress relaxation tests; surface mount solder joints; viscoplastic strains; waveforms; Capacitive sensors; Creep; Fatigue; Frequency; Performance evaluation; Plastics; Soldering; Stress; Temperature; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77760
  • Filename
    77760