• DocumentCode
    2957213
  • Title

    Locally rigid globally non-rigid surface registration

  • Author

    Fujiwara, Kent ; Nishino, Ko ; Takamatsu, Jun ; Zheng, Bo ; Ikeuchi, Katsushi

  • Author_Institution
    Inst. of Ind. Sci., Univ. of Tokyo, Tokyo, Japan
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    1527
  • Lastpage
    1534
  • Abstract
    We present a novel non-rigid surface registration method that achieves high accuracy and matches characteristic features without manual intervention. The key insight is to consider the entire shape as a collection of local structures that individually undergo rigid transformations to collectively deform the global structure. We realize this locally rigid but globally non-rigid surface registration with a newly derived dual-grid Free-form Deformation (FFD) framework. We first represent the source and target shapes with their signed distance fields (SDF). We then superimpose a sampling grid onto a conventional FFD grid that is dual to the control points. Each control point is then iteratively translated by a rigid transformation that minimizes the difference between two SDFs within the corresponding sampling region. The translated control points then interpolate the embedding space within the FFD grid and determine the overall deformation. The experimental results clearly demonstrate that our method is capable of overcoming the difficulty of preserving and matching local features.
  • Keywords
    feature extraction; image matching; image registration; FFD grid; characteristic features matching; dual-grid free-form deformation framework; global structure deformation; local structures collection; nonrigid surface registration method; signed distance fields; Accuracy; Aerospace electronics; Educational institutions; Registers; Shape; Three dimensional displays; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision (ICCV), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4577-1101-5
  • Type

    conf

  • DOI
    10.1109/ICCV.2011.6126411
  • Filename
    6126411