DocumentCode :
2957270
Title :
Multi-class AUC metrics and weighted alternatives
Author :
Van Calster, B. ; Van Belle, Vanya ; Condous, George ; Bourne, Tom ; Timmerman, Dirk ; Van Huffel, Sabine
Author_Institution :
Dept of Electr. Eng. (ESAT-SISTA), Katholieke Univ. Leuven, Leuven
fYear :
2008
fDate :
1-8 June 2008
Firstpage :
1390
Lastpage :
1396
Abstract :
The area under the receiver operating characteristic curve (AUC) is a useful and widely used measure to evaluate the performance of binary and multi-class classification models. However, it does not take into account the exact numerical output of the models, but rather looks at how the output ranks the cases. AUC metrics that incorporate the exact numerical output have been developed for binary classification. In this paper, we try to extend such weighted metrics to the multi-class case. Several metrics are suggested. Using real world data, we investigate intercorrelations between these metrics and demonstrate their use.
Keywords :
curve fitting; pattern classification; sensitivity analysis; binary classification model; multiclass classification model; receiver operating characteristic curve metrics; weighted metrics; Area measurement; Hospitals; Joining processes; Numerical models; Predictive models; Probability; Sensitivity; Statistics; Support vector machine classification; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
ISSN :
1098-7576
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
Type :
conf
DOI :
10.1109/IJCNN.2008.4633979
Filename :
4633979
Link To Document :
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