• DocumentCode
    2957296
  • Title

    Scan rectification for structured light range sensors with rolling shutters

  • Author

    Ringaby, Erik ; Forssén, Per-Erik

  • Author_Institution
    Dept. of Electr. Eng., Linkoping Univ., Linkoping, Sweden
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    1575
  • Lastpage
    1582
  • Abstract
    Structured light range sensors, such as the Microsoft Kinect, have recently become popular as perception devices for computer vision and robotic systems. These sensors use CMOS imaging chips with electronic rolling shutters (ERS). When using such a sensor on a moving platform, both the image, and the depth map, will exhibit geometric distortions. We introduce an algorithm that can suppress such distortions, by rectifying the 3D point clouds from the range sensor. This is done by first estimating the time continuous 3D camera trajectory, and then transforming the 3D points to where they would have been, if the camera had been stationary. To ensure that image and range data are synchronous, the camera trajectory is computed from KLT tracks on the structured-light frames, after suppressing the structured-light pattern. We evaluate our rectification, by measuring angles between the visible sides of a cube, before and after rectification. We also measure how much better the 3D point clouds can be aligned after rectification. The obtained improvement is also related to the actual rotational velocity, measured using a MEMS gyroscope.
  • Keywords
    CMOS image sensors; cameras; computational geometry; computer vision; 3D point cloud; CMOS imaging chip; ERS; MEMS gyroscope; Microsoft Kinect; electronic rolling shutter; geometric distortion; rotational velocity; scan rectification; structured light range sensor; time continuous 3D camera trajectory; Cameras; Simultaneous localization and mapping; Solid modeling; Spline; Three dimensional displays; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision (ICCV), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4577-1101-5
  • Type

    conf

  • DOI
    10.1109/ICCV.2011.6126417
  • Filename
    6126417