• DocumentCode
    2957431
  • Title

    The IMGC calibration set-up for microdisplacement actuators

  • Author

    Sacconi, A. ; Picotto, G.B. ; Pasin, W.

  • Author_Institution
    Ist. di Metrol., CNR, Torino, Italy
  • fYear
    1998
  • fDate
    6-10 July 1998
  • Firstpage
    385
  • Lastpage
    386
  • Abstract
    In the calibration of piezo-capacitive displacement actuators, use is made of an interferometric set-up with sub-nanometric resolution. In order to minimise the periodic non-linearity effect of the interferometer, accurate /spl lambda/-steps are obtained from a computer-based loop control of the out-of-phase between the reference and the measuring signal of the interferometer. Experimental results show a standard uncertainty of about 1 nm+0.7/spl middot/10/sup -4/ L//spl mu/m.
  • Keywords
    calibration; capacitive sensors; closed loop systems; digital control; displacement control; heterodyne detection; laboratory techniques; light interferometers; light interferometry; measurement by laser beam; measurement uncertainty; microactuators; micropositioning; optical control; piezoelectric actuators; position measurement; transfer standards; IMGC calibration set-up; PC-based control; accurate /spl lambda/-steps; capacitive sensors; closed loop displacement control; computer-based loop control; differential interferometer; digital control; heterodyne technique; integrated position sensors; interferometric set-up; microdisplacement actuators; optical path difference; periodic nonlinearity effect; piezo-capacitive displacement actuators; precise positioning; roundness measurement; signal out-of-phase; standard uncertainty; submicron metrology; subnanometric resolution; transfer standard; translators; Actuators; Calibration; Displacement control; Linearity; Nonlinear optics; Optical interferometry; Optical mixing; Optical receivers; Optical refraction; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1998 Conference on
  • Conference_Location
    Washington, DC, USA
  • Print_ISBN
    0-7803-5018-9
  • Type

    conf

  • DOI
    10.1109/CPEM.1998.699963
  • Filename
    699963