• DocumentCode
    2957578
  • Title

    A comparison of genetic and particle swarm optimization for contact formation in high-performance silicon solar cells

  • Author

    Kim, Hyun-Soo ; Morris, Bryan G. ; Han, Seung-Soo ; May, Gary S.

  • Author_Institution
    Dept. of Inf. Eng., Myongji Univ., Yongin
  • fYear
    2008
  • fDate
    1-8 June 2008
  • Firstpage
    1531
  • Lastpage
    1535
  • Abstract
    In this paper, statistical experimental design is used to characterize the contact formation process for high-performance silicon solar cells. Central composite design is employed, and neural networks trained by the error back-propagation algorithm are used to model the relationships between several input factors and solar cell efficiency. Subsequently, both genetic algorithms and particle swarm optimization are used to identify the optimal process conditions to maximize cell efficiency. The results of the two approaches are compared, and the optimized efficiency found via the particle swarm method was slightly larger than the value determined via genetic algorithms. More importantly, repeated applications of particle swarm optimization yielded process conditions with smaller standard deviations, implying greater consistency in recipe generation.
  • Keywords
    backpropagation; genetic algorithms; neural nets; particle swarm optimisation; solar cells; central composite design; contact formation; error backpropagation algorithm; genetic algorithms; genetic-particle swarm optimization; high-performance silicon solar cells; neural networks; recipe generation; Belts; Design for experiments; Furnaces; Genetic algorithms; Neural networks; Particle swarm optimization; Photovoltaic cells; Plasma temperature; Silicon; Surface contamination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-1820-6
  • Electronic_ISBN
    1098-7576
  • Type

    conf

  • DOI
    10.1109/IJCNN.2008.4633999
  • Filename
    4633999