About the existing discrepancy in the determinations of the Avogadro constant

Author

Martin, J. ; Bettin, H. ; Kuetgens, U. ; Schiel, D. ; Stumpel, J. ; Becker, P.

Author_Institution

Phys. Tech. Bundesanstalt, Braunschweig, Germany

fYear

1998

fDate

6-10 July 1998

Firstpage

387

Lastpage

388

Abstract

The values for the Avogadro constant, derived from the atomic and molar volume of silicon at several metrological institutes, show significant differences. To illuminate this discrepancy, comparison measurements of density, lattice parameters and positron annihilation were performed. The existing differences cannot be explained by the residual point defect contents but probably by small voids in the lattice.

Keywords

constants; density measurement; lattice constants; measurement uncertainty; positron annihilation; silicon; voids (solid); Avogadro constant; Si; atomic volume of silicon; average interatomic distance; comparison measurements; density; lattice parameters; molar volume of silicon; positron annihilation; silicon lattice spacing; small voids; Atomic measurements; Crystals; Density measurement; Impurities; Lattices; Performance evaluation; Positrons; Prototypes; Silicon; Temperature measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Precision Electromagnetic Measurements Digest, 1998 Conference on

Conference_Location

Washington, DC, USA

Print_ISBN

0-7803-5018-9

Type

conf

DOI

10.1109/CPEM.1998.699964

Filename

699964

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2957588