• DocumentCode
    2957634
  • Title

    Noise Modeling For Charge Amplification and Sampling

  • Author

    Pittet, Patrick ; Lu, Guo-Neng ; Quiquerez, Laurent

  • Author_Institution
    Univ. Claude Bernard Lyon 1, Villeurbanne
  • fYear
    2006
  • fDate
    10-13 Dec. 2006
  • Firstpage
    9
  • Lastpage
    12
  • Abstract
    A new cyclostationarity-based analytical model for noise analysis of a charge amplifier followed by a correlated double sampling (CDS) circuit is proposed. It determines output noise (power spectral density and squared voltage) resulting from input noise voltages and currents. Model validation is performed by comparing the obtained results with those of temporal noise simulations. This model allows analysis of consequences of CDS and integration duration on noise contributions. It predicts that CDS does not suppress or attenuate effect of input current sources. In the case of 1/f input noise current, the SNR can not be improved by increasing the integration duration.
  • Keywords
    amplifiers; circuit noise; charge amplification; charge amplifier; charge sampling; correlated double sampling circuit; cyclostationarity-based analytical model; model validation; noise modeling; power spectral density; squared voltage; temporal noise simulations; Analytical models; Capacitive sensors; Circuit noise; Circuit simulation; Frequency domain analysis; Instruments; Photodetectors; Sampling methods; Signal to noise ratio; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
  • Conference_Location
    Nice
  • Print_ISBN
    1-4244-0395-2
  • Electronic_ISBN
    1-4244-0395-2
  • Type

    conf

  • DOI
    10.1109/ICECS.2006.379668
  • Filename
    4263291