DocumentCode
2957634
Title
Noise Modeling For Charge Amplification and Sampling
Author
Pittet, Patrick ; Lu, Guo-Neng ; Quiquerez, Laurent
Author_Institution
Univ. Claude Bernard Lyon 1, Villeurbanne
fYear
2006
fDate
10-13 Dec. 2006
Firstpage
9
Lastpage
12
Abstract
A new cyclostationarity-based analytical model for noise analysis of a charge amplifier followed by a correlated double sampling (CDS) circuit is proposed. It determines output noise (power spectral density and squared voltage) resulting from input noise voltages and currents. Model validation is performed by comparing the obtained results with those of temporal noise simulations. This model allows analysis of consequences of CDS and integration duration on noise contributions. It predicts that CDS does not suppress or attenuate effect of input current sources. In the case of 1/f input noise current, the SNR can not be improved by increasing the integration duration.
Keywords
amplifiers; circuit noise; charge amplification; charge amplifier; charge sampling; correlated double sampling circuit; cyclostationarity-based analytical model; model validation; noise modeling; power spectral density; squared voltage; temporal noise simulations; Analytical models; Capacitive sensors; Circuit noise; Circuit simulation; Frequency domain analysis; Instruments; Photodetectors; Sampling methods; Signal to noise ratio; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location
Nice
Print_ISBN
1-4244-0395-2
Electronic_ISBN
1-4244-0395-2
Type
conf
DOI
10.1109/ICECS.2006.379668
Filename
4263291
Link To Document