Title :
Fragmentation of SiF/sub 4/ in the Avogadro amount comparator
Author :
Valkiers, S. ; Gonfiantini, R. ; Taylor, P. ; De Bievre, P.
Author_Institution :
Inst. for Reference Mater. & Measure., Eur. Commission, Geel, Belgium
Abstract :
Summary form only given, as follows. The determination of the correction factors for isotope fractionations for measurements of amount ratios of silicon-bearing ions has been undertaken in order to define correction equations for the isotope amount ratios measured on the SiF/sub 3//sup +/ ion beams used in the re-determinations of the Avogadro constant.
Keywords :
constants; distillation; electron impact ionisation; isotope relative abundance; isotope separation; mass spectra; mass spectroscopy; measurement uncertainty; silicon compounds; Avogadro amount comparator; SiF/sub 3/; SiF/sub 3//sup +/ ion beams; SiF/sub 4/; amount ratios measurement; correction equations; correction factors; electron impact ionisation; fragmentation of SiF/sub 4/; isotope fractionations; mass spectrometer ion source; second order ionisation reactions; silicon-bearing ions; Collaboration; Electron beams; Equations; Ion beams; Ion sources; Isotopes; Mass production; Mass spectroscopy; Performance evaluation;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.699966
