• DocumentCode
    2957927
  • Title

    A unifying framework for spectral analysis based dimensionality reduction

  • Author

    Zhang, Tianhao ; Tao, Dacheng ; Li, Xuelong ; Yang, Jie

  • Author_Institution
    Inst. of Image Process. & Pattern Recognition, Shanghai Jiao Tong Univ., Shanghai
  • fYear
    2008
  • fDate
    1-8 June 2008
  • Firstpage
    1670
  • Lastpage
    1677
  • Abstract
    Past decades, numerous spectral analysis based algorithms have been proposed for dimensionality reduction, which plays an important role in machine learning and artificial intelligence. However, most of these existing algorithms are developed intuitively and pragmatically, i.e., on the base of the experience and knowledge of experts for their own purposes. Therefore, it will be more informative to provide some a systematic framework for understanding the common properties and intrinsic differences in the algorithms. In this paper, we propose such a framework, i.e., ldquopatch alignmentrdquo, which consists of two stages: part optimization and whole alignment. With the proposed framework, various algorithms including the conventional linear algorithms and the manifold learning algorithms are reformulated into a unified form, which gives us some new understandings on these algorithms.
  • Keywords
    learning (artificial intelligence); optimisation; spectral analysis; artificial intelligence; dimensionality reduction; linear algorithms; machine learning; manifold learning algorithms; patch alignment; spectral analysis; spectral analysis based algorithms; Artificial intelligence; Biometrics; Clustering algorithms; Image processing; Level measurement; Linear discriminant analysis; Machine learning; Machine learning algorithms; Principal component analysis; Spectral analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1098-7576
  • Print_ISBN
    978-1-4244-1820-6
  • Electronic_ISBN
    1098-7576
  • Type

    conf

  • DOI
    10.1109/IJCNN.2008.4634022
  • Filename
    4634022