• DocumentCode
    2958017
  • Title

    Unstructured light scanning to overcome interreflections

  • Author

    Couture, Vincent ; Martin, Nicolas ; Roy, Sébastien

  • Author_Institution
    Univ. de Montreal, Montreal, QC, Canada
  • fYear
    2011
  • fDate
    6-13 Nov. 2011
  • Firstpage
    1895
  • Lastpage
    1902
  • Abstract
    Reconstruction from structured light can be greatly affected by interreflections between surfaces in the scene. This paper introduces band-pass white noise patterns designed specifically to reduce interreflections, and still be robust to standard challenges in scanning systems such as scene depth discontinuities, defocus and low camera-projector pixel ratio. While this approach uses unstructured light patterns that increase the number of required projected images, it is up to our knowledge the first method that is able to recover scene disparities in the presence of both scene discontinuities and interreflections. Furthermore, the method does not require calibration (geometric nor photometric) or post-processing such as dynamic programming or phase unwrapping. We show results for a challenging scene and compare them to correspondences obtained with the well-known Gray code and Phase-shift methods.
  • Keywords
    image reconstruction; band-pass white noise patterns; gray code; interreflections; low camera-projector pixel ratio; phase-shift method; scanning systems; scene depth discontinuities; scene discontinuities; unstructured light patterns; unstructured light scanning; Band pass filters; Calibration; Cameras; Lighting; Noise; Reflective binary codes; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Vision (ICCV), 2011 IEEE International Conference on
  • Conference_Location
    Barcelona
  • ISSN
    1550-5499
  • Print_ISBN
    978-1-4577-1101-5
  • Type

    conf

  • DOI
    10.1109/ICCV.2011.6126458
  • Filename
    6126458