• DocumentCode
    2958051
  • Title

    Using affinity set on mining the necessity of computed tomography scanning

  • Author

    Chen, Yuh-Wen ; Larbani, Moussa ; Li, Tzung-Hung ; Chen, Chao-Wen

  • Author_Institution
    Da-Yeh Univ., Changhua, Taiwan
  • fYear
    2009
  • fDate
    22-24 July 2009
  • Firstpage
    219
  • Lastpage
    223
  • Abstract
    Computed tomography (CT) is a medical imaging method of tomography. Digital geometry processing is used to generate a three-dimensional image of the inside of a patient from a large series of two-dimensional X-ray images taken around a single axis of rotation. The scanning of CT has become an important tool in medical imaging to supplement X-rays and medical ultrasonography. Although it is expensive, it is the best tool to diagnose a large number of different disease entities; especially, for the trauma patients in emergency room. In this study, the trauma patients, who were treated by the CT scanning are collected in order to discover the critical knowledge; that is, what characteristics of trauma patients would lead to the necessity of CT scanning? The data mining model of affinity set and neural network (NN) are both used for resolution and comparison. Finally, studying results show that he affinity model performs better than the NN model, but the collected data lacks the explanatory power in practices. Thus, a further research is necessary.
  • Keywords
    X-ray imaging; biomedical ultrasonics; computerised tomography; data mining; medical image processing; neural nets; set theory; affinity set; computed tomography scanning; digital geometry processing; medical imaging method; medical ultrasonography; neural network; two-dimensional X-ray images; Biomedical imaging; Computed tomography; Diseases; Geometry; Image generation; Medical diagnostic imaging; Medical treatment; Neural networks; Ultrasonography; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Service Operations, Logistics and Informatics, 2009. SOLI '09. IEEE/INFORMS International Conference on
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4244-3540-1
  • Electronic_ISBN
    978-1-4244-3541-8
  • Type

    conf

  • DOI
    10.1109/SOLI.2009.5203933
  • Filename
    5203933