Title :
Soft-decision hierarchical classification using SVM-type classifiers
Author :
Wang, Yu-Chiang Frank ; Casasent, David
Author_Institution :
Dept. of Electr. & Comput. Eng., Carnegie Mellon Univ., Pittsburgh, PA
Abstract :
In this paper, we address both recognition of true object classes and rejection of false (non-object) classes as occurs in many realistic pattern recognition problems. We modified our hierarchical binary-decision classifier to produce analog outputs at each node, with values proportional to the class conditional probabilities at that node. This yields a new soft-decision hierarchical system. The hierarchical classification structure is designed by our weighted support vector k-means clustering method, which selects the classes to be separated at each node in the hierarchy. Use of our SVRDM (support vector representation and discrimination machine) classifiers at each node provides generalization and rejection ability. Compared to the standard SVM, use of the Gaussian kernel function and a looser constraint in the classifier design give our SVRDM an improved rejection ability. The soft-decision SVRDM output allows us to use the confidence level of each class to improve the classification (for true class inputs) and rejection (for false class inputs) performance of the hierarchical classifier. False class rejection is a major new aspect of this work. It is not present in most prior work. Excellent test results on a real infra-red (IR) database are presented.
Keywords :
Gaussian processes; pattern classification; pattern clustering; support vector machines; Gaussian kernel function; SVM-type classifiers; false class rejection; hierarchical binary-decision classifier; hierarchical classification structure; pattern recognition problems; soft-decision hierarchical classification; support vector discrimination machine; support vector k-means clustering method; support vector representation machine; true object class recognition; Hydrogen; Neural networks; Support vector machines; Automatic target recognition; hierarchical classifier; pattern recognition; support vector machine (SVM);
Conference_Titel :
Neural Networks, 2008. IJCNN 2008. (IEEE World Congress on Computational Intelligence). IEEE International Joint Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-1820-6
Electronic_ISBN :
1098-7576
DOI :
10.1109/IJCNN.2008.4634041