• DocumentCode
    2958460
  • Title

    A new variational method to determine effective channel length and series resistance of MOSFET´s

  • Author

    Yamaguchi, K. ; Amishiro, H. ; Yamawaki, M. ; Asai, S.

  • Author_Institution
    Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    1998
  • fDate
    23-26 Mar 1998
  • Firstpage
    123
  • Lastpage
    126
  • Abstract
    A new variational method to determine the effective channel length and the series resistance of MOSFETs is proposed. It is analytically shown that there is nothing well defined, except for effective channel length at Vgt=0 in the resistance-based method. The new method yields constant effective channel length in the neighborhood of V gs=Vth and series resistance dependent on the gate voltage. The new method is well defined and gives accurate and consistent effective channel length and series resistance
  • Keywords
    MOSFET; electric resistance; semiconductor device models; variational techniques; MOSFET; constant effective channel length; effective channel length; gate voltage; resistance-based method; series resistance; variational method; Circuit synthesis; Electric resistance; Electrical resistance measurement; Laboratories; MOSFET circuits; Monitoring; Threshold voltage; Ultra large scale integration; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1998. ICMTS 1998., Proceedings of the 1998 International Conference on
  • Conference_Location
    Kanazawa
  • Print_ISBN
    0-7803-4348-4
  • Type

    conf

  • DOI
    10.1109/ICMTS.1998.688054
  • Filename
    688054
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2958460