Title :
A Low-Power and Low Silicon Area Testable CMOS LNA Dedicated to 802.15.4 Sensor Network Applications
Author :
Cimino, M. ; de Matos, M. ; Lapuyade, H. ; Taris, T. ; Deval, Y. ; Bégueret, J-B
Author_Institution :
IXL Lab., Bordeaux
Abstract :
A low noise amplifier designed in a 0.13 mum CMOS VLSI technology is presented, which has self-test capabilities in order to monitor its behavior within a ZigBee sensor network during its life time. The silicon area required for both the built-in self test circuitry and the LNA has been optimized in order to reduce the overall cost of the function, using a shunt-feedback topology. The LNA provides a measured power gain of 10 dBm and a 2.4 dB noise figure, while consuming only 3.6 mW under a 1.2 V power supply. The test chip has been designed for robustness to fit a mass production requirements. The test chip demonstrates that the addition of the self-test circuitry has no impact on the LNA performances, while being efficient.
Keywords :
CMOS analogue integrated circuits; VLSI; built-in self test; low noise amplifiers; low-power electronics; personal area networks; wireless sensor networks; 802.15.4 sensor network; CMOS VLSI technology; LNA; ZigBee sensor network; built-in self test circuitry; noise figure 2.4 dB; power 3.6 mW; size 0.13 mum; voltage 1.2 V; Automatic testing; Built-in self-test; CMOS technology; Circuit noise; Circuit testing; Low-noise amplifiers; Monitoring; Silicon; Very large scale integration; ZigBee; Built-In Current Sensor; Built-In Self Test; CMOS VLSI; Low power; Low voltage; RF Low Noise Amplifier; Robustness;
Conference_Titel :
Electronics, Circuits and Systems, 2006. ICECS '06. 13th IEEE International Conference on
Conference_Location :
Nice
Print_ISBN :
1-4244-0395-2
Electronic_ISBN :
1-4244-0395-2
DOI :
10.1109/ICECS.2006.379805
